Imaging microwave electric fields using a near-field scanning microwave microscope - Dutta, S. K.; Vlahacos, C. P.; Steinhauer, D. E.; Thanawalla, Ashfaq S.; Feenstra, B. J.; Wellstood, F. C.; Anlage, Steven M. (American Institute of Physics (AIP), 1999)
http://dx.doi.org/10.1063/1.123137
Keywords: U