Sakai, K., Yamagami, T., & Ojima, K. (1999). Observation of change in shape of oxygen precipitates in high-temperature annealed silicon by transmission electron microscopy. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationSakai, K., T. Yamagami, and K. Ojima. Observation of Change in Shape of Oxygen Precipitates in High-temperature Annealed Silicon by Transmission Electron Microscopy. Woodbury, NY: American Institute of Physics (AIP), 1999.
MLA (9th ed.) CitationSakai, K., et al. Observation of Change in Shape of Oxygen Precipitates in High-temperature Annealed Silicon by Transmission Electron Microscopy. American Institute of Physics (AIP), 1999.
Warning: These citations may not always be 100% accurate.