APA (7th ed.) Citation

Xu, Z., Tan, X., Han, P., & Shang, J. K. (2000). In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Xu, Z., X. Tan, P. Han, and J. K. Shang. In Situ Transmission Electron Microscopy Study of Electric-field-induced Microcracking in Single Crystal Pb(Mg1/3Nb2/3)O3–PbTiO3. Woodbury, NY: American Institute of Physics (AIP), 2000.

MLA (9th ed.) Citation

Xu, Z., et al. In Situ Transmission Electron Microscopy Study of Electric-field-induced Microcracking in Single Crystal Pb(Mg1/3Nb2/3)O3–PbTiO3. American Institute of Physics (AIP), 2000.