Focused nanoparticle-beam deposition of patterned microstructures - Di Fonzo, F.; Gidwani, A.; Fan, M. H.; Neumann, D.; Iordanoglou, D. I.; Heberlein, J. V. R.; McMurry, P. H.; Girshick, S. L. (American Institute of Physics (AIP), 2000)
http://dx.doi.org/10.1063/1.1306638
Keywords: U