Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates - Gim, Y.; Hudson, T.; Fan, Y.; Kwon, C.; Findikoglu, A. T.; Gibbons, B. J.; Park, B. H.; Jia, Q. X. (American Institute of Physics (AIP), 2000)
http://dx.doi.org/10.1063/1.1289272
Keywords: U