APA (7th ed.) Citation

Malyarchuk, V., Tomm, J. W., Talalaev, V., & Lienau, C. (2002). Nanoscopic measurements of surface recombination velocity and diffusion length in a semiconductor quantum well. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Malyarchuk, V., J. W. Tomm, V. Talalaev, and Ch Lienau. Nanoscopic Measurements of Surface Recombination Velocity and Diffusion Length in a Semiconductor Quantum Well. Woodbury, NY: American Institute of Physics (AIP), 2002.

MLA (9th ed.) Citation

Malyarchuk, V., et al. Nanoscopic Measurements of Surface Recombination Velocity and Diffusion Length in a Semiconductor Quantum Well. American Institute of Physics (AIP), 2002.