Current transport across a grain boundary in polycrystalline semiconductors

Lu, C.-Y. ; Lu, N.C.-C.

Amsterdam : Elsevier
ISSN:
0038-1101
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Physics
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1016/0038-1101(83)90170-3