Study of preferential sputtering on binary alloy by in-situ Auger measurement of sputtered and sputter-deposited surfaces

Shimizu, R. ; Saeki, N.

Amsterdam : Elsevier

ISSN:	0039-6028
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0039-6028(77)90114-5