Mozume, T., Kashima, H., Hosomi, K., Ogata, K., Suenaga, K., & Nakano, A. Gas source molecular beam epitaxy and X-ray absorption fine structure characterization of InGaAs/InP short period superlattices. Elsevier.
Chicago Style (17th ed.) CitationMozume, T., H. Kashima, K. Hosomi, K. Ogata, K. Suenaga, and A. Nakano. Gas Source Molecular Beam Epitaxy and X-ray Absorption Fine Structure Characterization of InGaAs/InP Short Period Superlattices. Amsterdam: Elsevier.
MLA (9th ed.) CitationMozume, T., et al. Gas Source Molecular Beam Epitaxy and X-ray Absorption Fine Structure Characterization of InGaAs/InP Short Period Superlattices. Elsevier.
Warning: These citations may not always be 100% accurate.