Improved high resolution image processing of bright field electron micrographs - II. Experiment - Kirkland, E.J.; Siegel, B.M.; Uyeda, N.; Fujiyoshi, Y. (Elsevier)
The new methods of nonlinear image processing are applied to high resolution experimental micrographs of chlorinated copper phthalocyanine taken on the Kyoto 500 kV electron microscope. With these new methods of image processing the phase and amplitude of the specimen transmission function are reconstructed from a defocus series of conventional transmission electron micrographs (bright field). Strong scattering, partial coherence and statistical noise have been included. Both of these new methods are based on the MAP (maximum a posteriori) criterion generalized to include reconstruction from multiple input images. In a companion paper (the first part of this two-part report) the theory behind these methods was presented and in this paper it is tested on actual experimental micrographs. A significant increase in resolution has been obtained with computer image processing. The point-to-point resolution obtained here with computer image processing of 500 kV electron micrographs is of the order of 1.2-1.4 Å which represents a 30-50% increase in resolution.
http://linkinghub.elsevier.com/retrieve/pii/0304-3991(85)90002-6
Keywords: ZN; TA-TD; U