AES and factor analysis study of silicide growth at the Pd/c-Si interface

Steren, L. ; Vidal, R. ; Ferron, J.

Amsterdam : Elsevier

ISSN:	0169-4332
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0169-4332(87)90047-X