Temperature dependence of residual stress in epitaxial GaAs/Si(100) films determined from photoreflectance spectroscopy data - Kuz’menko, R. V.; Ganzha, A. V.; Bochurova, O. V.; Domashevskaya, É. P.; Schreiber, J.; Hildebrandt, S.; Mo, S.; Peiner, E.; Schlachetzki, A. (Springer, 2000)
http://dx.doi.org/10.1134/1.1187949
Keywords: ZN; U