Determination of interface state density of PtSi/strained-Si1-xGex/Si Schottky diodes - Chattopadhyay, S.; Bera, L. K.; Maiti, C. K.; Ray, S. K.; Bose, P. K.; Dentel, D.; Kubler, L.; Bischoff, J. L. (Springer, 1998)
http://dx.doi.org/10.1023/A:1008948500597
Keywords: ZN; ZL