Park, K. S., Kim, N. B., Woo, H. J., Kim, D. K., Kim, J. K., & Choi, H. W. (1991). Determination of impurities in semiconductor grade silicon by instrumental neutron activation analysis. Springer.
Chicago Style (17th ed.) CitationPark, K. S., N. B. Kim, H. J. Woo, D. K. Kim, J. K. Kim, and H. W. Choi. Determination of Impurities in Semiconductor Grade Silicon by Instrumental Neutron Activation Analysis. Springer, 1991.
MLA (9th ed.) CitationPark, K. S., et al. Determination of Impurities in Semiconductor Grade Silicon by Instrumental Neutron Activation Analysis. Springer, 1991.
Warning: These citations may not always be 100% accurate.