Electrical properties of Al-SiO2Si structure with plasmochemical insulator: Potential barrier heights and electron capture in SiO2 - Skrypnik, É. A.; Blagodarov, A. N.; Kunin, V. Ya.; Kochnev, I. V.; Zhuravov, V. D.; Bulan'kov, N. I. (Springer, 1981)
http://dx.doi.org/10.1007/BF00894498
Keywords: U