Taylor, D., Pritchard, T. I., Butler, I. C., & Evans, P. S. A. (1995). Increased sensitivity when testing linear circuits using transient response analysis. Springer.
Chicago Style (17th ed.) CitationTaylor, D., T. I. Pritchard, I. C. Butler, and P. S. A. Evans. Increased Sensitivity When Testing Linear Circuits Using Transient Response Analysis. Springer, 1995.
MLA (9th ed.) CitationTaylor, D., et al. Increased Sensitivity When Testing Linear Circuits Using Transient Response Analysis. Springer, 1995.
Warning: These citations may not always be 100% accurate.