Highly enriched $^{28}\mathrm{Si}$ reveals remarkable optical linewidths and fine structure for well-known damage centers
C. Chartrand, L. Bergeron, K. J. Morse, H. Riemann, N. V. Abrosimov, P. Becker, H.-J. Pohl, S. Simmons, and M. L. W. Thewalt
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
| Publication Date: |
2018-11-06
|
|---|---|
| Publisher: |
American Physical Society (APS)
|
| Print ISSN: |
1098-0121
|
| Electronic ISSN: |
1095-3795
|
| Topics: |
Physics
|
| Keywords: |
Semiconductors I: bulk
|
| Published by: |