Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials - Zhang, D., Zhu, Y., Liu, L., Ying, X., Hsiung, C.-E., Sougrat, R., Li, K., Han, Y. (American Association for the Advancement of Science (AAAS), 2018)
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Keywords: W; V; TE-TZ; SQ-SU; WW-YZ; TA-TD; U