Search Results - (Author, Cooperation:X. Mu)
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1Latest Papers from Table of Contents or Articles in PressZhang, Y., Hu, X., Mu, J., Hu, Y., Zhou, Y., Zhao, H., Wu, C., Pei, R., Chen, J., Chen, X., Wang, Y.
The American Society for Microbiology (ASM)
Published 2018Staff ViewPublication Date: 2018-05-30Publisher: The American Society for Microbiology (ASM)Print ISSN: 0022-538XElectronic ISSN: 1098-5514Topics: MedicinePublished by: -
2Latest Papers from Table of Contents or Articles in PressY. Xu, W. Cai, Y. Ma, X. Mu, L. Hu, Tao Chen, H. Wang, Y. P. Song, Zheng-Yuan Xue, Zhang-qi Yin, and L. Sun
American Physical Society (APS)
Published 2018Staff ViewPublication Date: 2018-09-12Publisher: American Physical Society (APS)Print ISSN: 0031-9007Electronic ISSN: 1079-7114Topics: PhysicsKeywords: General Physics: Statistical and Quantum Mechanics, Quantum Information, etc.Published by: -
3Latest Papers from Table of Contents or Articles in PressStaff View
Publication Date: 2013-08-03Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsKeywords: China ; Faculty/*standards ; *Government Programs ; Science/*educationPublished by: -
4Latest Papers from Table of Contents or Articles in PressStaff View
Publication Date: 2018-11-06Publisher: Institute of Physics (IOP)Print ISSN: 1755-1307Electronic ISSN: 1755-1315Topics: GeographyGeosciencesPhysicsPublished by: -
5Latest Papers from Table of Contents or Articles in PressF. Zhou ; X. Li ; W. Wang ; P. Zhu ; J. Zhou ; W. He ; M. Ding ; F. Xiong ; X. Zheng ; Z. Li ; Y. Ni ; X. Mu ; L. Wen ; T. Cheng ; Y. Lan ; W. Yuan ; F. Tang ; B. Liu
Nature Publishing Group (NPG)
Published 2016Staff ViewPublication Date: 2016-05-27Publisher: Nature Publishing Group (NPG)Print ISSN: 0028-0836Electronic ISSN: 1476-4687Topics: BiologyChemistry and PharmacologyMedicineNatural Sciences in GeneralPhysicsPublished by: -
6Articles: DFG German National LicensesMu, X. C. ; Fonash, S. J. ; Oehrlein, G. S. ; Chakravarti, S. N. ; Parks, C. ; Keller, J.
[S.l.] : American Institute of Physics (AIP)
Published 1986Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: A comprehensive characterization of the damage and contamination produced in silicon by CC1F3/H2 reactive ion etching is presented. This highly selective SiO2-to-Si reactive ion etching process unfortunately produces all three of the deleterious damage-contamination layers that can result from dry etching exposure; viz., CC1F3/H2 reactive ion etching produces a residue layer on the Si surface, a permeated layer at the Si near-surface, and a layer of damaged Si. Various post-RIE-exposure, surface-recovery approaches are evaluated in this report. The results indicate that in order to restore the surface to a device-quality state, it is not sufficient to simply eliminate surface contamination. Damage incurred in the silicon bonding must be restored or removed. The latter can be accomplished by suitable treatments such as wet chemical silicon etch or silicide formation.Type of Medium: Electronic ResourceURL: -
7Articles: DFG German National LicensesMu, X. C. ; Fonash, S. J. ; Yang, B. Y. ; Vedam, K. ; Rohatgi, A. ; Rieger, J.
[S.l.] : American Institute of Physics (AIP)
Published 1985Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: Damage produced in single-crystal silicon by two distinctly different dry etching techniques, Ar ion beam etching and CCl4 reactive ion etching is characterized and compared using spectroscopic ellipsometry, reflected high- energy electron diffraction, and current-voltage (I-V) characteristics of Au contacts to the etched Si. Secondary ion mass spectroscopy is also used to further characterize the CCl4 exposed samples. The effectiveness of low-energy hydrogen ion implants in passivating this dry etching induced damage is explored. The restoration of I-V characteristics caused by H+ implants is correlated with the evolution of the spectroscopic ellipsometry, reflected high- energy electron diffraction, and secondary ion mass spectroscopy data.Type of Medium: Electronic ResourceURL: -
8Articles: DFG German National LicensesStaff View
ISSN: 0305-750XSource: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: GeographyPolitical ScienceSociologyType of Medium: Electronic ResourceURL: -
9Articles: DFG German National LicensesStaff View
ISSN: 0305-750XSource: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: GeographyPolitical ScienceSociologyType of Medium: Electronic ResourceURL: -
10Articles: DFG German National LicensesStaff View
ISSN: 0030-4018Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: PhysicsType of Medium: Electronic ResourceURL: -
11Articles: DFG German National LicensesZhang, Y.-J. ; Qian, Y.-Q. ; Mu, X.-J. ; Cai, Q.-G. ; Zhou, Y.-L. ; Wei, X.-P.
Springer
Published 1998Staff ViewISSN: 1432-203XKeywords: Key wordsActinidia eriantha ; Chromosome number ; Multinucleate cells ; Plant regeneration ; Protoplast cultureSource: Springer Online Journal Archives 1860-2000Topics: BiologyNotes: Abstract Newly expanded in vitro leaves of Actinidia eriantha were used for protoplast isolation. Protoplasts were cultured in liquid MS medium (lacking NH4NO3) supplemented with 2,4-D (2,4-dichlorophenoxyacetic acid) and 0.4 M glucose. The plating efficiency after 3 weeks of culture was 19.4%, and calli were recovered without addition of fresh medium. These calli regenerated shoots on transfer to MS medium containing 2.28 μM zeatin and 0.57 μM IAA (indole-3-acetic acid). Regenerated shoots were rooted by immersion in 20 ppm IBA (indole-3-butyric acid) solution before culturing on half-strength MS medium lacking growth regulators. Somaclonal variation, in terms of chromosome number and nuclei per cell of protoplast-derived plants, was estimated.Type of Medium: Electronic ResourceURL: -
12Articles: DFG German National LicensesRen, Q. ; Wang, Z. G. ; Guo, S. Y. ; Mu, X. D. ; Zhang, G. H. ; Xu, D. ; Trivedi, Sudhir B.
Springer
Published 1997Staff ViewISSN: 1573-4811Source: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsType of Medium: Electronic ResourceURL: -
13Articles: DFG German National LicensesStaff View
ISSN: 1040-0397Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: Chemistry and PharmacologyNotes: The construction and utilization of a simple light-transparent NaCl thin-layer FTIR spectroelectrochemical cell for transparency measurements is reported. This cell has a 0.25-mm optical pathlength and a three-electrode configuration. The application of this cell for in situ FTIR measurements is demonstrated for the electrooxidation of (OEP)lr(CO)Cl, (TPP)Co(NO), and (TPP)Fe(NO) (where OEP and TPP are the dianions of octaethyl- and tetraphenylporphyrin, respectively) in methylene chloride solutions containing 0.1 M tetrabutylammonium perchlorate (TBAP). Under these solution conditions, spectral changes of the investigated compounds can be monitored between 2500 and 800 cm-1. Well-defined thin-layer cyclic voltammograms of these investigated complexes and diagnostic IR absorption peaks for bound CO and NO as well as for porphyrin π cation radicals are obtained in CH2Cl2 solutions containing 0.1 M TBAP. These in situ generated data are compared with literature IR data for chemically oxidized metalloporphyrins in the solid state.Additional Material: 5 Ill.Type of Medium: Electronic ResourceURL: -
14Articles: DFG German National LicensesStaff View
ISSN: 1040-0397Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: Chemistry and PharmacologyNotes: The construction and utilization of a column-shaped in situ thin-layer ESR spectroelectrochemical cell for both ambient and low temperature operation is reported. The working electrode is a columnshaped expanded platinum sheet of 9.4 × 4.0 mm that is placed in a 0.25 mm thick column-shaped, thin-layer chamber. The solution volume in the thin-layer chamber is 12 μL, and the total solution volume in the cell ranges between 1 and 3 mL. The application of this cell is demonstrated by time-resolved ESR spectra for electrooxidized porphyrins in methylene chloride solutions containing 0.3 M tetrabutylammonium perchlorate. The electrochemical behavior of this cell is also demonstrated by the oxidation of ferrocene under the same solution conditions at temperatures between 23 and -75°C. Well-defined ESR spectra are obtained in as short as 5-10 seconds without data manipulation.Additional Material: 6 Ill.Type of Medium: Electronic ResourceURL: -
15Articles: DFG German National LicensesStaff View
ISSN: 1040-0397Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: Chemistry and PharmacologyNotes: The microvoltammetry and spectroelectrochemistry of (TPP)Co (where TPP is the dianion of tetraphenylporphyrin) are reported in toluene and benzene solutions, and provide the first examples of spectroelectrochemistry in these two low dielectric constant solvents. (TPP)Co undergoes four reversible oxidation-reduction reactions in toluene or benzene. The reductions involve one-electron transfers and occur at E1/2 = -0.86 and -2.03 V vs. SCE in both solvents. The oxidations involve the successive reversible abstraction of two electrons and one electron from the initial (TPP)Co species and occur at E1/2 = 1.00 and 1.27 V vs. SCE in both solvents. Each electrode reaction was spectrally and electrochemically characterized in toluene and benzene, and the data in these two solvents are compared to data obtained in CH2Cl2 where (TPP)Co redox reaçtions have been extensively characterized in detail. Special emphasis is placed on comparing the thin-layer spectra of [(TPP)Co1] in toluene and benzene with that in other solvents commonly used for nonaqueous electrochemical studies.Additional Material: 3 Ill.Type of Medium: Electronic ResourceURL: -
16Latest Papers from Table of Contents or Articles in PressStaff View
Publication Date: 2018-02-03Publisher: Institute of Physics (IOP)Print ISSN: 1757-8981Electronic ISSN: 1757-899XTopics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsPublished by: