Search Results - (Author, Cooperation:J. Shang)

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  1. 1
    R. Riedinger ; S. Hong ; R. A. Norte ; J. A. Slater ; J. Shang ; A. G. Krause ; V. Anant ; M. Aspelmeyer ; S. Groblacher
    Nature Publishing Group (NPG)
    Published 2016
    Staff View
    Publication Date:
    2016-01-19
    Publisher:
    Nature Publishing Group (NPG)
    Print ISSN:
    0028-0836
    Electronic ISSN:
    1476-4687
    Topics:
    Biology
    Chemistry and Pharmacology
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    Latest Papers from Table of Contents or Articles in Press
  2. 2
    Staff View
    Publication Date:
    2018-01-31
    Publisher:
    The American Society for Microbiology (ASM)
    Print ISSN:
    0022-538X
    Electronic ISSN:
    1098-5514
    Topics:
    Medicine
    Published by:
    Latest Papers from Table of Contents or Articles in Press
  3. 3
    Xu, Z. ; Tan, X. ; Han, P. ; Shang, J. K.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 2000
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3–0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described. © 2000 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    Articles: DFG German National Licenses
  4. 4
    Tan, X. ; Xu, Z. ; Shang, J. K.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 2000
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    In situ transmission electron microscopy study of electric field-induced cracking has been conducted on 〈001〉 oriented 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 crystal. Fracture of the 90° domain boundary was directly observed in the tetragonal area under both static and alternating electric fields. The field strength required to induce domain boundary cracking was lower for alternating electric field than for static field. © 2000 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    Articles: DFG German National Licenses
  5. 5
    Shang, J. Q. ; Scholte, J. W. ; Rowe, R. K.
    Springer
    Published 2000
    Staff View
    ISSN:
    1573-9317
    Keywords:
    Complex permittivity ; soil characterization ; multiple linear regression
    Source:
    Springer Online Journal Archives 1860-2000
    Topics:
    Architecture, Civil Engineering, Surveying
    Geosciences
    Notes:
    Abstract The complex permittivities of 40 compacted natural clayey till specimens at various water content, density and pore fluid salinity as independent variables are analyzed. A multiple linear regression model is constructed and the statistical analyses for the relative permittivity (ε') and dielectric loss (ε '')-regression equations in the frequency range from 200 to 400MHz are performed. It is concluded that the multiple linear regression model of the complex permittivity is highly significant. The coefficient of determination (R 2) and standard error (SE) of the linear regression equations vary with frequency. At 200MHz for ε ' -regression and 300MHz for ε '-regression, all three independent soil variables are significant at a probability of 0.95. The complex permittivity regression model with two variables at 250MHz for ε 'and 350 for ε '-regression equations. Upon further study on the effect of soil mineralogy to the complex permittivity, the results obtained in this study may serves as the principle of the characterization of subsurface and detection of soil and groundwater contamination.
    Type of Medium:
    Electronic Resource
    URL:
    Articles: DFG German National Licenses